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Thin Film Thickness Measurement System for LCD
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Thin Film Thickness Measurement System for LCD
Detailed Product Description
Measurement System is intended for thin films thickness measurement on various size wafer. We are able to supply up to 1 square meter sample stage with travel distance up to 50x50 cm. The measurement range is 100A - 50u. Spot size is 40/20/10/4 um. Data acquisition time is 0.5 sec typically.
Contact Information
Contact Person:
Ms. Vera Shapovalova
Job Title:
Marketing Strategy Team Member
Address:
104-11 Moonji Dong Yusung Ku, Taejon, Daejeon, South Korea
Country:
South Korea
Zip/Postal Code:
305-380
Telephone:
82-42-868-6868
Fax:
82-42-868-6867
Website:
http://www.kmac.to
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